Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
1993 | PSBIST: A Partial-Scan Based Built-In Self-Test Scheme. | Lin, Chih-Jen; Zorian, Yervant; Bhawmik, Sudipta; CHIH-JEN LIN | Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993 |