Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2009 | Very-Low-Voltage Testing of Amorphous Silicon TFT Circuits. | Shen, Shiue-Tsung; Liu, Wei-Hsiao; Ma, En-Hua; Li, James Chien-Mo; I-CHUN CHENG ; CHIEN-MO LI | Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan | 1 | 0 | |
2008 | 一種適用於非同步電路之可測試設計 | 鄭啟玄; Cheng, Chi-Hsuan |