Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2011 | Test-Clock Domain Optimization for Peak Power-Supply Noise Reduction During Scan | CHIEN-MO LI ; R.Y. Wen; Y.C. Huang; M.H. Tsai; K.Y. Liao; J. C.-M. Li; M.-T. Chang; M.-H. Tsai; C.-M. Tseng; H.-C. Li; CHIEN-MO LI | International Test Conference |