Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
2009 | A novel ontology-based knowledge engineering approach for yield symptom identification in semiconductor manufacturing | Su, F.-H.; Chang, S.-C.; Fan, C.-M.; Tsai, Y.-J.; Jheng, J.; Kao, C.-P.; Lu, C.-Y.; SHI-CHUNG CHANG | 2009 IEEE International Conference on Automation Science and Engineering | 0 | 0 | |
2001 | Data mining and fault diagnosis based on wafer acceptance test data and in-line manufacturing data | Fan, C.-M.; Guo, R.-S.; Chen, A.; Hsu, K.-C.; ARGON CHEN ; RUEY-SHAN GUO | IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings | 12 | 0 | |
2005 | Design of collaborative engineering data system (CEDS): An application case of process integration | Fan, C.-M.; Chang, S.-C.; Chang, H.; SHI-CHUNG CHANG | IEEE International Symposium on Semiconductor Manufacturing Conference | | | |
2009 | Hunting efficiency and predation risk shapes the color-associated foraging traits of a predator | Fan, C.-M.; EN-CHENG YANG ; Tso, I.-M. | Behavioral Ecology | | | |
2008 | Knowledge engineering of analysis tool application processes for yield symptom identification | Su, F.-H.; Chang, S.-C.; Tsai, Y.-J.; Lu, C.-Y.; Fan, C.-M.; SHI-CHUNG CHANG | IEEE International Symposium on Semiconductor Manufacturing Conference | | | |
2007 | Service oriented platform design for collaborative engineering data analysis | Lee, J.-R.; Chang, S.-C.; Su, F.-H.; Fan, C.-M.; SHI-CHUNG CHANG | IEEE International Symposium on Semiconductor Manufacturing Conference | 2 | 0 | |
2000 | SHEWMAC: An end-of-line SPC scheme via exponentially weighted moving statistics | Fan, C.-M.; SHI-CHUNG CHANG ; RUEY-SHAN GUO ; Kung, H.-H.; You, J.-C.; Chen, H.-P.; Lin, S.; Wei, C.-S. | 2000 Semiconductor Manufacturing Technology Workshop | 2 | 0 | |