https://scholars.lib.ntu.edu.tw/handle/123456789/120508
Title: | Interdisciplinary characterization of sandwiched SiGe thin layers grown by molecular beam epitaxy | Authors: | Feng, Z.C. Watt, F. Lee, K.K. Wee, A.T.S. Hng, H.H. Arbet-Engels, V. Karunasiri, R.P.G. Wang, K.L. William, K.P.J. |
Issue Date: | Jan-1995 | Start page/Pages: | 2-3-9-2-3-12 | Source: | International Electron Devices and Materials Symposium | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/193682 | DOI: | 10.1109/EDMS.1994.863768 |
Appears in Collections: | 光電工程學研究所 |
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