https://scholars.lib.ntu.edu.tw/handle/123456789/294588
Title: | Testing for Resistive and Stuck Opens | Authors: | CHIEN-MO LI Li, J. C.M. Tseng, C.W. E.J. McCluskey CHIEN-MO LI |
Issue Date: | Jan-2001 | Start page/Pages: | 1049-1058 | Source: | International Test Conference | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/294588 | DOI: | 10.1109/test.2001.966731 |
Appears in Collections: | 電子工程學研究所 |
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