https://scholars.lib.ntu.edu.tw/handle/123456789/323246
Title: | Measuring and modeling the scaling trend of the RF noise in MOSFETs | Authors: | Kao, H Chin, Albert Liao, C Mcalister, Sean Kwo, J Hong, M MINGHWEI HONG |
Issue Date: | 2006 | Source: | 2006 64th Device Research Conference | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/323246 |
Appears in Collections: | 應用物理研究所 |
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