https://scholars.lib.ntu.edu.tw/handle/123456789/356363
Title: | Characterization of stacked hafnium oxide (HfO2) /silicon dioxide (SiO2) metal-oxide-semiconductor tunneling temperature sensors | Authors: | Wang, C.-Y. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 2010 | Journal Volume: | 157 | Journal Issue: | 10 | Source: | Journal of the Electrochemical Society | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-77956223100&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/356363 |
DOI: | 10.1149/1.3467866 |
Appears in Collections: | 電機工程學系 |
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