https://scholars.lib.ntu.edu.tw/handle/123456789/359563
Title: | An ADC/DAC Loopback Testing Methodology by DAC Output Offsetting and Scaling | Authors: | Xuan-Lun Huang Jiun-Lang Huang JIUN-LANG HUANG |
Issue Date: | Apr-2010 | Start page/Pages: | 289-294 | Source: | VLSI Test Symposium | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/359563 | DOI: | 10.1109/VTS.2010.5469548 |
Appears in Collections: | 電子工程學研究所 |
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