https://scholars.lib.ntu.edu.tw/handle/123456789/381695
Title: | A circular pipeline processing based deterministic parallel test pattern generator | Authors: | K.-W. Yeh J.-L. Huang H.-J. Chao L.-T. Wang JIUN-LANG HUANG |
Issue Date: | Sep-2013 | Source: | International Test Conference | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/381695 | DOI: | 10.1109/TEST.2013.6651913 |
Appears in Collections: | 電子工程學研究所 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.