https://scholars.lib.ntu.edu.tw/handle/123456789/404506
Title: | Simulation-based study of negative-capacitance double-gate tunnel field-effect transistor with ferroelectric gate stack | Authors: | Liu, C. Chen, P.-G. Xie, M.-J. Liu, S.-N. Lee, J.-W. Huang, S.-J. Liu, S. Chen, Y.-S. Lee, H.-Y. Liao, M.-H. Chen, P.-S. Lee, M.-H. |
Issue Date: | 2016 | Journal Volume: | 55 | Journal Issue: | 4 | Start page/Pages: | 492-508 | Source: | Japanese Journal of Applied Physics | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/404506 | DOI: | 10.7567/JJAP.55.04EB08 |
Appears in Collections: | 電機工程學系 |
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