https://scholars.lib.ntu.edu.tw/handle/123456789/404512
Title: | Systematic Investigation of Self-Heating Effect on CMOS Logic Transistors from 20 to 5 nm Technology Nodes by Experimental Thermoelectric Measurements and Finite Element Modeling | Authors: | Liao, M.-H. Hsieh, C.-P. Lee, C.-C. |
Issue Date: | 2017 | Journal Volume: | 64 | Journal Issue: | 2 | Start page/Pages: | 12.1.1-12.1.4 | Source: | IEEE Transactions on Electron Devices | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/404512 | DOI: | 10.1109/TED.2016.2642404 |
Appears in Collections: | 電機工程學系 |
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