https://scholars.lib.ntu.edu.tw/handle/123456789/502111
Title: | Modeling and simulation of TSV induced keep-out zone using silicon data | Authors: | Liu, C.W. Yan, J.-Y. Jan, S.-R. CHEE-WEE LIU |
Issue Date: | 2016 | Start page/Pages: | 331-333 | Source: | 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2016 - Proceedings | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/502111 | DOI: | 10.1109/ICSICT.2016.7998912 |
Appears in Collections: | 電機工程學系 |
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