Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2012 | XRD characterization for Al- and N-doped 3C-SiC on Si (100) substrate after pulsed excimer laser anneal | Lee, K.-Y.; Huang, Y.-H.; Huang, C.-F.; Chung, C.Y.; Lin, S.C.; KUNG-YEN LEE | Materials Science Forum | 1 | 0 |