公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2006 | A quadratic goal programming model and sensitivity analysis for semiconductor supply chain | Chiang, D.; Guo, R.-S.; Chen, A.; ARGON CHEN ; MING-HUANG CHIANG ; RUEY-SHAN GUO | IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings | 0 | 0 | |
2013 | Quantitative analysis of dynamic power doppler sonograms for patients with thyroid nodules | MING-HSUN WU ; CHIUNG-NIEN CHEN ; KUEN-YUAN CHEN ; MING-CHIH HO ; HAO-CHIH TAI ; Chung, Yuan-Chang; Lo, Chan-Peng; ARGON CHEN ; KING-JEN CHANG | Ultrasound in Medicine and Biology | 22 | 22 | |
2016 | Quantitative analysis of echogenicity for patients with thyroid nodules | MING-HSUN WU ; CHIUNG-NIEN CHEN ; KUEN-YUAN CHEN ; MING-CHIH HO ; HAO-CHIH TAI ; Wang, Yu-Hsin; Chen, A.; ARGON CHEN ; KING-JEN CHANG | Scientific Reports | 32 | 32 | |
2011 | Rare-event splitting simulation for analysis of power system blackouts | Wang, S.-P.; Chen, A.; Liu, C.-W.; Chen, C.-H.; CHIH-WEN LIU ; ARGON CHEN | IEEE Power and Energy Society General Meeting | 19 | 0 | |
2003 | Rationality and Risk Analysis in Capacity Planning | Chou, Yon-Chun ; Chen, Argon | | | | |
2000 | Real-time equipment health evaluation and dynamic preventive maintenance | Chen, Argon ; Guo, R.S.; Wu, G.S. | The Ninth International Symposium on Semiconductor Manufacturing, 2000 | 0 | 0 | |
2007 | Real-time equipment health prognosis and dynamic preventive maintenance policy | Chen, Argon ; Wu, G.S. | International Journal of Production Research | | | |
1998 | A real-time equipment monitoring and fault detection system | Guo, R.S.; Chen, A.; Tseng, C.L.; Fong, I.K.; Yang, A.; Lee, C.L.; Wu, C.H.; Lin, S. ; Huang, S.J.; Lee, Y.C.; Chang, S.G.; RUEY-SHAN GUO ; ARGON CHEN | Semiconductor Manufacturing Technology Workshop | 8 | 0 | |
2007 | Real-time health prognosis and dynamic preventive maintenance policy for equipment under aging Markovian deterioration | Chen, Argon ; Wu, G.S. | International Journal of Production Research | 65 | 46 | |
2009 | Recipe-Independent Indicator for Tool Health Diagnosis and Predictive Maintenance | Chen, A.; ARGON CHEN ; JAKEY BLUE ; Chen, Argon | IEEE Transactions on Semiconductor Manufacturing | 33 | 29 | |
2006 | Recipe-independent tool health indicator and fault prognosis | Chen, A.; Blue, J.; Chou, T.-C.; ARGON CHEN ; JAKEY BLUE | IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings | 2 | 0 | |
2021 | Risk Stratification in Patients With Follicular Neoplasm on Cytology: Use of Quantitative Characteristics and Sonographic Patterns | MING-HSUN WU ; KUEN-YUAN CHEN ; MIN-SHU HSIEH ; ARGON CHEN ; CHIUNG-NIEN CHEN | Frontiers in Endocrinology | 4 | 3 | |
1999 | Run-to-run control of CMP process considering aging effects of pad and disc | Chen, Argon ; Guo, Ruey-Shan ; Chou, Y.L.; Lin, C.L.; Dun, Jowei; ARGON CHEN | Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on | 6 | 0 | |
2000 | Run-to-run control schemes for CMP process subject to deterministic drifts | Guo, Ruey-Shan ; Chen, Argon; ARGON CHEN | Semiconductor Manufacturing Technology Workshop | 18 | 0 | |
2006 | Sample Efficient Regression Trees (SERT) for yield loss analysis | Chen, A.; Hong, A.; Ho, O.; Liu, C.-W.; Huang, Y.-H.; ARGON CHEN | IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings | | | |
2010 | Sample-Efficient Regression Trees (SERT) for Semiconductor Yield Loss Analysis | Chen, Argon ; Hong, Amos | IEEE Transactions on Semiconductor Manufacturing | 14 | 12 | |
1999 | A self-tuning run-by-run process controller for processes subject to random disturbances | Guo R.-S.; Chen J.-J.; Chen A.; Lu S.-S.; RUEY-SHAN GUO ; ARGON CHEN | Journal of the Chinese Institute of Engineers, Transactions of the Chinese Institute of Engineers,Series A/Chung-kuo Kung Ch'eng Hsuch K'an | 5 | 4 | |
2003 | Semiconductor product-mix estimate with dynamic weighting scheme | Chen, Argon ; Hsia, Ziv; Yang, Kyle | 2003 IEEE International Symposium on Semiconductor Manufacturing | | | |
2021 | Software-Based Analysis of the Taller-Than-Wide Feature of High-Risk Thyroid Nodules | MING-HSUN WU ; KUEN-YUAN CHEN ; ARGON CHEN ; CHIUNG-NIEN CHEN | Annals of surgical oncology | 6 | 4 | |
2000 | Statistical analysis and design of semiconductor manufacturing systems | Chen, Argon ; Guo, P.S.; Lin, Puffy | The Ninth International Symposium on Semiconductor Manufacturing, 2000 | 0 | 0 | |