公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2003 | Ultra-thin Cr <inf>2</inf> O <inf>3</inf> well-crystallized films for high transmittance APSM in ArF line | Lai, F.D.; Huang, C.Y.; Chang, C.M.; Wang, L.A.; LON A. WANG | Microelectronic Engineering | 33 | 33 | |
2016 | X-ray absorption fine structure of ZnO thin film on Si and sapphire grown by MOCVD | Xin, J.; Chang, C.M.; Hsueh, C.-H.; Lee, J.-F.; Chen, J.-M.; Lin, H.-H.; Lu, N.; Ferguson, I.T.; Guan, Y.; Wan, L.; Yang, Q.; Feng, Z.C.; HAO-HSIUNG LIN | 2016 5th International Symposium on Next-Generation Electronics, ISNE 2016 |