Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2007 | Influence of STI-induced mechnical stress in kink effect of 65nm PD SOI CMOS devices | I. Lin; V. Su; J. Kuo; R. Lee; G. Lin; D. Chen; C. Yeh; C. Tsai; M. Ma; JAMES-B KUO | Electron Devices and Solid State State Circuits (EDSSC) Conf | 1 | 0 | |
2007 | Investigation of Substrate Noise Isolation Solutions in Deep Submicron CMOS Technology | H. Lin; J. Kuo; r. Sobot; M. Syrzycki; JAMES-B KUO | Canadian Conference on Electrical and Computer Engineering | 2 | 0 |