Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2012 | The influence of dislocations on optical and electrical properties of epitaxial ZnO on Si (111) using a 帠-Al <inf>2</inf>O <inf>3</inf> buffer layer | Liu, W.-R.; Lin, B.H.; Yang, S.; Kuo, C.C.; Li, Y.-H.; Hsu, C.-H.; Hsieh, W.F.; Lee, W.C.; MINGHWEI HONG ; Kwo, J. | CrystEngComm | |||
2013 | Vertical-cavity and randomly scattered lasing from different thicknesses of epitaxial ZnO films grown on Y<inf>2</inf>O<inf>3</inf>-buffered Si (111) | Kuo, C.C.; Liu, W.-R.; Lin, B.H.; Hsieh, W.F.; Hsu, C.-H.; Lee, W.C.; MINGHWEI HONG ; Kwo, J. | Optics Express |