Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2006 | Measuring interface strains at the atomic resolution in depth using x-ray Bragg-surface diffraction | Sun, W.C.; Chang, H.C.; Wu, B.K.; Chen, Y.R.; Chu, C.H.; Chang, S.L.; MINGHWEI HONG ; Tang, M.T.; Stetsko, Y.P. | Applied Physics Letters |