Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2017 | Ultra-high thermal stability and extremely low D<inf>it</inf> on HfO<inf>2</inf>/p-GaAs(001) interface | Wan, H.W.; Lin, Y.H.; Lin, K.Y.; Chang, T.W.; Cai, R.F.; Kwo, J.; Hong, M.; MINGHWEI HONG | Microelectronic Engineering | 9 | 9 |