Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
1998 | Electronic and microstructure characterization of strontium-bismuth tantalate (SBT) thin films | Hartmann A.J.; Lamb R.N.; Scott J.F.; Johnston P.N.; El Bouanani M.; Chen C.W.; Robertson J.; CHUN-WEI CHEN | Journal of the Korean Physical Society | |||
1999 | Surface characterisation of strontium-bismuth tantalate (SBT) thin films | Hartmann A.J.; Lamb R.N.; Scott J.F.; Johnston P.N.; El Bouanani M.; Chen C.W.; Robertson J.; CHUN-WEI CHEN | Integrated Ferroelectrics |