Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2000 | Extended x-ray absorption fine-structure measurement of bond-length strain in epitaxial Gd<inf>2</inf>O<inf>3</inf> on GaAs(001) | Nelson, E.J.; Woicik, J.C.; MINGHWEI HONG ; Kwo, J.; Mannaerts, J.P. | Applied Physics Letters |