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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
An at-speed self-testable technique for the high speed domino adder
Details
An at-speed self-testable technique for the high speed domino adder
Journal
Proceedings of the Custom Integrated Circuits Conference
Date Issued
2011
Author(s)
Wang, Y.-S.
Hsieh, M.-H.
Liu, C.-M.
Liu, C.-W.
Li, J.C.-M.
CHIEN-MO LI
CHUNG-PING CHEN
DOI
10.1109/CICC.2011.6055417
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/501014
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-80455168089&doi=10.1109%2fCICC.2011.6055417&partnerID=40&md5=600d9045793b33383823465674c079f4
Type
conference paper