Comparative Leakage Analysis of GeOI FinFET and Ge Bulk FinFET

Journal

IEEE Transactions on Electron Devices

Journal Volume

60

Pages

3596-3600

Date Issued

2013

Author(s)

V. P.-H. Hu

M.-L. Fan

P. Su

C.-T. Chuang

V. P.-H. Hu

M.-L. Fan

P. Su

C.-T. Chuang

DOI

10.1109/ted.2013.2278032

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/516597

Type

journal article