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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
An ADC/DAC Loopback Testing Methodology by DAC Output Offsetting and Scaling
Details
An ADC/DAC Loopback Testing Methodology by DAC Output Offsetting and Scaling
Journal
VLSI Test Symposium
Pages
289-294
Date Issued
2010-04
Author(s)
Xuan-Lun Huang
Jiun-Lang Huang
JIUN-LANG HUANG
DOI
10.1109/VTS.2010.5469548
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/359563
Type
conference paper
