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College of Science / 理學院
Physics / 物理學系
Growth mechanism of atomic layer deposited Al<inf>2</inf>O<inf>3</inf>on GaAs(001)-4 ? 6 surface with trimethylaluminum and water as precursors
Details
Growth mechanism of atomic layer deposited Al2O3on GaAs(001)-4 ? 6 surface with trimethylaluminum and water as precursors
Journal
Applied Physics Letters
Journal Volume
101
Journal Issue
21
Date Issued
2012
Author(s)
Huang, M.L.
Chang, Y.H.
Lin, T.D.
Lin, H.Y.
Liu, Y.T.
Pi, T.W.
MINGHWEI HONG
Kwo, J.
DOI
10.1063/1.4767129
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/443342
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84870015446&doi=10.1063%2f1.4767129&partnerID=40&md5=b3d667d8673df6746d3abf1c1969cf0b
Type
journal article