Sigma-delta modulation based wafer-level testing for TFT-LCD source driver ICs
Journal
VLSI Test Symposium
Pages
315-320
Date Issued
2011-05
Author(s)
Abstract
Output variation testing of TFT-LCD source driver ICs is very expensive and time-consuming due to the large amount of analog output channels and levels to measure. This paper presents a low-cost on-scribe-line BIST technique for wafer-level source driver IC testing. Based on the BIST structure and the sigma-delta modulation principle, we propose a two-stage test flow and construct a generalized test cost function to find the optimal test setup parameters.
Type
conference paper