https://scholars.lib.ntu.edu.tw/handle/123456789/147536
Title: | Locating logic design errors via test generation and don't-care propagation | Authors: | Kuo, Sy-Yen | Issue Date: | Sep-1992 | Start page/Pages: | - | Source: | Design Automation Conference, 1992. EURO-VHDL '92, EURO-DAC '92. European | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/2007041910032329 | Other Identifiers: | N/A | DOI: | 10.1109/EURDAC.1992.246202 |
Appears in Collections: | 電機工程學系 |
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00246202.pdf | 369.69 kB | Adobe PDF | View/Open |
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