https://scholars.lib.ntu.edu.tw/handle/123456789/149248
Title: | Minority-Carrier Lifetime Measurement Using an Al/SiO2/p-Si MOS Capacitor | Authors: | 林浩雄 Jih, H. J. Lin, Hao-Hsiung |
Issue Date: | 1989 | Start page/Pages: | 87-90 | Source: | 15th EDMS | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/121462 |
Appears in Collections: | 電機工程學系 |
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