https://scholars.lib.ntu.edu.tw/handle/123456789/149699
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lai, W. | zh-TW |
dc.contributor.author | Kung, C. | zh-TW |
dc.contributor.author | 林呈祥 | zh-TW |
dc.contributor.author | Lin, Chen-Shang | en |
dc.creator | Lai, W.;Kung, C.;林呈祥 | zh-TW |
dc.creator | Lai, W.;Kung, C.;Lin, Chen-Shang | en |
dc.date | 1993 | en |
dc.date.accessioned | 2009-02-04T21:07:27Z | - |
dc.date.accessioned | 2018-07-06T11:02:17Z | - |
dc.date.available | 2009-02-04T21:07:27Z | - |
dc.date.available | 2018-07-06T11:02:17Z | - |
dc.date.issued | 1993 | - |
dc.identifier.uri | http://ntur.lib.ntu.edu.tw//handle/246246/121613 | - |
dc.language | en | en |
dc.language.iso | en_US | - |
dc.relation | EDAC-EUROASIC, Paris(1993.02) | en |
dc.relation | Proceedings of EDAC-EUROASIC, p.489-493 | en |
dc.relation.ispartof | EDAC-EUROASIC | - |
dc.title | Test Time Reduction in Scan Designed Circuits | en |
dc.type | conference paper | en |
dc.relation.pages | - | - |
item.openairetype | conference paper | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
item.fulltext | no fulltext | - |
item.grantfulltext | none | - |
item.languageiso639-1 | en_US | - |
item.cerifentitytype | Publications | - |
Appears in Collections: | 電機工程學系 |
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