https://scholars.lib.ntu.edu.tw/handle/123456789/153855
Title: | Flat-Band Annealing Behavior of Co-60 Irradiated Silicon MOS Capacitors | Authors: | Hwu, Jenn-Gwo | Issue Date: | 1989 | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/153904 |
Appears in Collections: | 電機工程學系 |
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