https://scholars.lib.ntu.edu.tw/handle/123456789/155896
Title: | Roughness- Enhanced Reliability of MOS Tunneling Diodes | Authors: | Lin, C.-H. Yuan, F. Shie, C.-R. Chen, K.-F. Hsu, B.-C. Lee, M.H. Pai, W.W. Liu, C.W. |
Issue Date: | 2002 | Journal Volume: | 23 | Journal Issue: | 7 | Start page/Pages: | 431-433 | Source: | IEEE Electron Device Letters | URI: | http://ntur.lib.ntu.edu.tw//handle/246246/148178 |
Appears in Collections: | 電機工程學系 |
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