DC 欄位 | 值 | 語言 |
dc.contributor | Dept. of Electr. Eng., National Taiwan Univ. | en |
dc.contributor.author | C.-Y. Kuo | en_US |
dc.contributor.author | JIUN-LANG HUANG | en_US |
dc.creator | C.-Y. Kuo;J.-L. Huang | - |
dc.date.accessioned | 2018-09-10T06:03:14Z | - |
dc.date.available | 2018-09-10T06:03:14Z | - |
dc.date.issued | 2006-04 | - |
dc.identifier.uri | https://www.scopus.com/inward/record.uri?eid=2-s2.0-33751104775&doi=10.1109%2fVTS.2006.10&partnerID=40&md5=bb7b172b6d2de067ff6d6d873b628d3a | - |
dc.description.abstract | In this paper, an on-chip sinusoidal jitter extraction technique based on period tracking is presented. The proposed technique is a viable on-chip solution. It utilizes a variable delay line and a phase comparator to track the signal's cycle lengths without external reference. Digital signal processing techniques are then applied to the obtained signal period sequence to derive the amplitudes and frequencies of the sinusoidal jitter components. Numerical simulations are performed to validate the idea. The results show that the proposed approach can achieve high amplitude and frequency estimation accuracy and is robust in the presence of random jitter components and delay line variations. © 2006 IEEE. | - |
dc.format | application/pdf | en |
dc.format.extent | 463308 bytes | - |
dc.format.mimetype | application/pdf | - |
dc.language | en | en |
dc.relation | VLSI Test Symposium, 2006. Proceedings. 24th IEEE | en |
dc.relation.ispartof | Proceedings of the IEEE VLSI Test Symposium | - |
dc.source | AH-anncc | - |
dc.subject | Built-in self-diagnosis; Built-in self-test; Jitter decomposition; Sinusoidal jitter | - |
dc.subject.other | Built-in self test; Computer simulation; Digital signal processing; Electric delay lines; Jitter; Built-in self-diagnosis; Jitter decomposition; Sinusoidal jitter; Chip scale packages | - |
dc.title | A period tracking based on-chip sinusoidal jitter extraction technique | - |
dc.type | conference paper | en |
dc.relation.conference | 24th IEEE VLSI Test Symposium | - |
dc.identifier.doi | 10.1109/VTS.2006.10 | - |
dc.identifier.scopus | 2-s2.0-33751104775 | - |
dc.relation.pages | 400 - 405 | - |
dc.relation.journalvolume | 2006 | - |
item.fulltext | with fulltext | - |
item.openairetype | conference paper | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
item.grantfulltext | open | - |
item.cerifentitytype | Publications | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Program in Integrated Circuit Design and Automation | - |
crisitem.author.orcid | 0000-0002-9425-3855 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | Graduate School of Advanced Technology | - |
顯示於: | 電子工程學研究所
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