https://scholars.lib.ntu.edu.tw/handle/123456789/332395
Title: | Comprehensive study on dynamic bias temperature instability of p-channel polycrystalline silicon thin-film transistors | Authors: | CHEE-WEE LIU Huang, C.-F. Yang, Y.-J. Peng, C.-Y. Sun, H.-C. Liu, C.W. Chao, C.-W. Lin, K.-C. CHEE-WEE LIU |
Issue Date: | 2007 | Source: | 2007 International Semiconductor Device Research Symposium | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-44949116082&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/332395 |
DOI: | 10.1109/ISDRS.2007.4422557 |
Appears in Collections: | 電機工程學系 |
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