https://scholars.lib.ntu.edu.tw/handle/123456789/341158
Title: | Comprehensive study of bias temperature instability on polycrystalline silicon thin-film transistors | Authors: | CHEE-WEE LIU Huang, C.-F. Chen, Y.-T. Sun, H.-C. Liu, C.W. Hsu, Y.-C. Shih, C.-C. Lin, K.-C. Chen, J.-S. CHEE-WEE LIU |
Issue Date: | 2008 | Start page/Pages: | 624-627 | Source: | International Conference on Solid-State and Integrated Circuits Technology, ICSICT | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-60649098199&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/341158 |
DOI: | 10.1109/ICSICT.2008.4734622 |
Appears in Collections: | 電機工程學系 |
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