https://scholars.lib.ntu.edu.tw/handle/123456789/342565
Title: | Analysis of STI Mechanical-Stress Induced Effects on 40nm PD SOI NMOS Devices | Authors: | JAMES-B KUO | Issue Date: | Nov-2008 | Source: | IEDMS | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/342565 |
Appears in Collections: | 電機工程學系 |
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