https://scholars.lib.ntu.edu.tw/handle/123456789/388864
Title: | Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects | Authors: | E. H. Ma W. E. Wei H. Y. Li J. C. M. Li I. C. Cheng Y. H. Yeh I-CHUN CHENG CHIEN-MO LI |
Issue Date: | Jan-2014 | Journal Volume: | 10 | Journal Issue: | 1 | Start page/Pages: | 19-26 | Source: | IEEE Journal of Display Technology | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/388864 | DOI: | 10.1109/JDT.2013.2277590 |
Appears in Collections: | 電子工程學研究所 |
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