https://scholars.lib.ntu.edu.tw/handle/123456789/394566
Title: | Analysis of Subthreshold Behavior of SOI NMOS De ice Considering Back-Gate-Bias-Related Flaoting Body Effect | Authors: | S. K. Hu JAMES-B KUO |
Issue Date: | Mar-2015 | Source: | Workshop on Microelectronics and Electron Devices (WMED) | Description: | Boise, USA |
URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/394566 |
Appears in Collections: | 電機工程學系 |
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