https://scholars.lib.ntu.edu.tw/handle/123456789/404567
Title: | The investigation of selfheating effect on Si1-xGex FinFETs with different device structures, Ge concentration, and operated voltages | Authors: | M. H.Liao C.-P. Hsieh C.-C. Lee |
Issue Date: | 2017 | Journal Volume: | 7 | Start page/Pages: | 55105 | Source: | AIP Advances | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/404567 |
Appears in Collections: | 電機工程學系 |
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