CPP-ATPG: A Circular Pipeline Processing Based Deterministic Parallel Test Pattern Generator

Journal

Journal of Electronic Testing: Theory and Applications

Journal Volume

32

Journal Issue

5

Pages

12ค๋15ค้

Date Issued

2016

Author(s)

K.-W. Yeh

J.-L. Huang

L.-T. Wang

JIUN-LANG HUANG

DOI

10.1007/s10836-016-5615-z

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/429671

Type

journal article