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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
An IR-drop guided test pattern generation technique
Details
An IR-drop guided test pattern generation technique
Journal
International Symposium on VLSI Design, Automation and Test
Date Issued
2016
Author(s)
L.-C. Tsai
J.-Z. Li
Y.-T. Lin
J.-L. Huang
A. Shih
Z. F. Conroy
JIUN-LANG HUANG
DOI
10.1109/vlsi-dat.2016.7482581
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/429672
Type
conference paper