https://scholars.lib.ntu.edu.tw/handle/123456789/429674
Title: | An IR-drop aware test pattern generator for scan-based at-speed testing | Authors: | P.-F. Hou Y.-T. Lin J.-L. Huang A. Shih Z. F. Conroy JIUN-LANG HUANG |
Issue Date: | 2016 | Source: | Asian Test Symposium | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/429674 | ISSN: | 10817735 | DOI: | 10.1109/ats.2016.23 |
Appears in Collections: | 電子工程學研究所 |
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