https://scholars.lib.ntu.edu.tw/handle/123456789/443458
Title: | Depth profiling the electronic structures at HfO<inf>2</inf>/Si interface grown by molecular beam epitaxy | Authors: | Lay, T.S. Chang, S.C. Din, G.J. Yeh, C.C. Hung, W.H. Lee, W.G. Kwo, J. MINGHWEI HONG |
Issue Date: | 2005 | Journal Volume: | 23 | Journal Issue: | 3 | Start page/Pages: | 1291-1293 | Source: | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/443458 | DOI: | 10.1116/1.1881633 |
Appears in Collections: | 物理學系 |
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