https://scholars.lib.ntu.edu.tw/handle/123456789/445783
Title: | Electrical Characterization of the Insulating Property of Ta2o5 in Al-Ta2o5-Sio2-Si Capacitors by a Low-Frequency C/V Technique | Authors: | Hwu, Jg Lin, St SHIANG-TAI LIN |
Issue Date: | 1990 | Journal Volume: | 137 | Journal Issue: | 5 | Start page/Pages: | 390-396 | Source: | Iee Proceedings-G Circuits Devices and Systems | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/445783 | ISSN: | 0956-3768 | DOI: | 10.1049/ip-g-2.1990.0060 |
Appears in Collections: | 化學工程學系 |
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