https://scholars.lib.ntu.edu.tw/handle/123456789/447950| Title: | The investigation of self-heating effect on Si<inf>1-x</inf>Ge<inf>x</inf> FinFETs with different device structures, Ge concentration, and operated voltages | Authors: | Liao, M.-H. Hsieh, C.-P. Lee, C.-C. MING-HAN LIAO |
Issue Date: | 2017 | Journal Volume: | 7 | Journal Issue: | 5 | Source: | AIP Advances | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/447950 | DOI: | 10.1063/1.4983401 |
| Appears in Collections: | 機械工程學系 |
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