https://scholars.lib.ntu.edu.tw/handle/123456789/498039
Title: | Atomic-Scale Structural and Chemical Characterization of Hexagonal Boron Nitride Layers Synthesized at the Wafer-Scale with Monolayer Thickness Control | Authors: | Lin, W.-H. Brar, V.W. Jariwala, D. Sherrott, M.C. Tseng, W.-S. Wu, C.-I. Yeh, N.-C. Atwater, H.A. CHIH-I WU |
Issue Date: | 2017 | Journal Volume: | 29 | Journal Issue: | 11 | Start page/Pages: | 4700-4707 | Source: | Chemistry of Materials | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/498039 | DOI: | 10.1021/acs.chemmater.7b00183 |
Appears in Collections: | 電機工程學系 |
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