Histogram-based calibration of capacitor mismatch and comparator offset for 1-bit/stage pipelined ADCs

Journal

Journal of Electronic Testing: Theory and Applications (JETTA)

Journal Volume

27

Journal Issue

4

Pages

441-453

Date Issued

2011

Author(s)

Huang, X.-L.

Kang, P.-Y.

Yu, Y.-C.

JIUN-LANG HUANG

DOI

10.1007/s10836-011-5231-x

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/501335

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-80052964050&doi=10.1007%2fs10836-011-5231-x&partnerID=40&md5=f27070cfc9896302ef3c2e2150650b88

Type

journal article