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College of Electrical Engineering and Computer Science / 電機資訊學院
Electrical Engineering / 電機工程學系
Logic and fault simulation
Details
Logic and fault simulation
Journal
VLSI Test Principles and Architectures
Pages
105-159
Date Issued
2006
Author(s)
Huang, J.-L.
Li, J.C.-M.
Walker, D.M.
DOI
10.1016/B978-012370597-6/50007-X
URI
https://scholars.lib.ntu.edu.tw/handle/123456789/501336
URL
https://www.scopus.com/inward/record.uri?eid=2-s2.0-84882503755&doi=10.1016%2fB978-012370597-6%2f50007-X&partnerID=40&md5=58fb18761f3aec03e5aea5b5d9c6540a
Type
book part