A built-in characterization technique for 1-bit/stage pipelined ADC

Journal

Proceedings of the Asian Test Symposium

Pages

284-289

Date Issued

2012

Author(s)

Chou, Y.-H.

Huang, J.-L.

Huang, X.-L.

JIUN-LANG HUANG

DOI

10.1109/ATS.2012.21

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/501342

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-84872521868&doi=10.1109%2fATS.2012.21&partnerID=40&md5=7a413e2e705faf6607b0efcc826b7cc3

Type

conference paper