Testability Measures Considering Circuit Reconvergence to Reduce ATPG Runtime
Journal
Proceedings - 2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2019
Date Issued
2019
Author(s)
Abstract
Reconvergence has been recognized as the main reason for ATPG backtrack. It induces not only more, but also prolonged backtracks and causes more severe performance degradation than expected. In this paper, we propose a reconvergence-aware testability measure to better guide the ATPG justification process. Experiment results show that the proposed method significantly decreases the ATPG runtime, especially for circuits with deep logic level, by up to 76%. © 2019 IEEE.
Event(s)
22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2019
Subjects
ATPG; backtrack; reconvergence; Testability
Other Subjects
ATPG; backtrack; Justification process; Logic levels; Performance degradation; Re convergences; Testability; Testability measures; Timing circuits
Type
conference paper